Method for forming short-channel transistors

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Reexamination Certificate

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06998318

ABSTRACT:
A method for forming short-channel transistors, including removing a residual sacrificial layer pattern used to mask an LDD ion-implant layer through etching; forming second spacers on side walls where the residual sacrificial layer pattern is removed; forming a punch-stop ion implant layer between the second spacers; etching the first oxide layer, and forming a gate insulation layer; and forming a gate where the residual sacrificial layer pattern is removed.

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