Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-02-14
2006-02-14
Smith, Matthew (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
Reexamination Certificate
active
06998318
ABSTRACT:
A method for forming short-channel transistors, including removing a residual sacrificial layer pattern used to mask an LDD ion-implant layer through etching; forming second spacers on side walls where the residual sacrificial layer pattern is removed; forming a punch-stop ion implant layer between the second spacers; etching the first oxide layer, and forming a gate insulation layer; and forming a gate where the residual sacrificial layer pattern is removed.
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DongbuAnam Semiconductor Inc.
Fortney Andrew D.
Malsawma Lex H.
Smith Matthew
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