Semiconductor integrated circuit detecting glitch noise and...

Details Semiconductor integrated circuit detecting glitch noise and... Semiconductor integrated circuit detecting glitch noise and...

2006-11-21

2006-11-21

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S700000, C714S817000

Reexamination Certificate

active

07139952

ABSTRACT:
A semiconductor integrated circuit having a plurality of wirings and a scan chain including a testing circuit configured to detect glitch noise caused by crosstalk between the wirings and a plurality of scan flip-flops connected in series, the semiconductor integrated circuit includes a retention circuit receiving a data signal propagating a test-subject wiring, and a detection circuit receiving the data signal and an output signal of the retention circuit, detecting glitch noise occurring in the data signal, and delivering an output signal to the retention circuit.

REFERENCES:
patent: 6442721 (2002-08-01), Whetsel
patent: 6594805 (2003-07-01), Tetelbaum et al.
patent: 6907590 (2005-06-01), Al-Dabagh et al.
patent: 7039891 (2006-05-01), Tetelbaum
patent: 2002/0124218 (2002-09-01), Kishimoto
patent: 2001-305191 (2001-10-01), None
patent: 2002/257903 (2002-09-01), None

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