Silicided buried bitline process for a non-volatile memory cell

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S211000, C438S257000

Reexamination Certificate

active

07125763

ABSTRACT:
A process of fabricating a memory cell that includes a substrate that has a first region and a second region with a channel therebetween by forming a gate above the channel of the substrate, forming a bitline and siliciding the bitline.

REFERENCES:
patent: 5250846 (1993-10-01), Kondo
patent: 5739569 (1998-04-01), Chen
patent: 5859454 (1999-01-01), Choi et al.
patent: 5879990 (1999-03-01), Dormans et al.
patent: 5910925 (1999-06-01), Guterman et al.
patent: 5942782 (1999-08-01), Hsu
patent: 6051858 (2000-04-01), Uchida et al.
patent: 6174758 (2001-01-01), Nachumovsky
patent: 6211548 (2001-04-01), Ma
patent: 6218695 (2001-04-01), Nachumovsky
patent: 6346442 (2002-02-01), Aloni et al.
patent: 6477084 (2002-11-01), Eitan
patent: 6518124 (2003-02-01), Ebina et al.
patent: 6575546 (2003-06-01), Matsumoto et al.
patent: 2002/0142546 (2002-10-01), Kouznetsov et al.
patent: 57-177566 (1982-11-01), None

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