Method for the defect analysis of memory modules

Details Method for the defect analysis of memory modules Method for the defect analysis of memory modules

2006-10-17

2006-10-17

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S718000

Reexamination Certificate

active

07124336

ABSTRACT:
A computer system has at least one data defect memory, at least one address defect memory and also a test program. The computer system is connected to a memory module that has a memory space with defect-free and defective memory cells, a plurality of data lines, and a plurality of address lines. The addresses of the defective memory cells in the memory space and the data lines that are connected to the defective memory cells are determined from the information items of the address defect memory and also from the information items of the data defect memory.

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