Method of depositing a material layer

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

Reexamination Certificate

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C438S692000, C438S622000

Reexamination Certificate

active

07115516

ABSTRACT:
A method of layer formation on a substrate with high aspect ratio features is disclosed. The layer is formed from a gas mixture comprising one or more process gases and one or more etch species. The one or more process gases react to deposit a material layer on the substrate. In conjunction with the material layer deposition, the etch species selectively remove portions of the deposited material layer adjacent to high aspect ratio feature openings, filling such features in a void-free and/or seam-free manner. The material layer may be deposited on the substrate using physical vapor deposition (PVD) and/or chemical vapor deposition (CVD) techniques.

REFERENCES:
patent: 4788082 (1988-11-01), Schmitt
patent: 4874493 (1989-10-01), Pan
patent: 5089442 (1992-02-01), Olmer
patent: 5108543 (1992-04-01), Suzuki et al.
patent: 5256205 (1993-10-01), Schmitt, III et al.
patent: 5356672 (1994-10-01), Schmitt et al.
patent: 5356673 (1994-10-01), Schmitt et al.
patent: 5445699 (1995-08-01), Kamikawa et al.
patent: 5571332 (1996-11-01), Halpern
patent: 5614055 (1997-03-01), Fairbairn et al.
patent: 5650197 (1997-07-01), Halpern
patent: 5720821 (1998-02-01), Halpern
patent: 5725672 (1998-03-01), Schmitt et al.
patent: 5759634 (1998-06-01), Zang
patent: 5814564 (1998-09-01), Yao et al.
patent: 5833817 (1998-11-01), Tsai et al.
patent: 5893758 (1999-04-01), Sandhu et al.
patent: 5926737 (1999-07-01), Ameen et al.
patent: 5983906 (1999-11-01), Zhao et al.
patent: 6030881 (2000-02-01), Papasouliotis et al.
patent: 6077786 (2000-06-01), Chakravarti et al.
patent: 6100200 (2000-08-01), Van Buskirk et al.
patent: 6117781 (2000-09-01), Lukanc et al.
patent: 6136685 (2000-10-01), Narwankar et al.
patent: 6144894 (2000-11-01), Nguyen
patent: 6211040 (2001-04-01), Liu et al.
patent: 2004/0077161 (2004-04-01), Chen et al.
patent: 0 591 082 (1994-04-01), None
patent: 04-007825 (1992-01-01), None
patent: WO 99/47728 (1999-09-01), None
Van Zant, Peter; Microchip Fabrication 2000; McGraw-Hill; Fourth Edition, 401-403.
PCT International Search Report from International Application No. PCT/US02/30278, Dated Dec. 19, 2002.

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