Semiconductor device and method for testing the same

Details Semiconductor device and method for testing the same Semiconductor device and method for testing the same

2006-10-31

2006-10-31

Kerveros, James C. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07131042

ABSTRACT:
Test board configurations and test method for semiconductor devices with simultaneous bi-directional (SBD) data ports are disclosed. The devices have two SBD data ports with a pass mode that relays data between the ports. Significantly, each device contains configurable switching elements that allow a test mode, wherein unidirectional input/output data on one SBD data port is mapped to bi-directional data on the other SBD data port. This allows device testing with automated test equipment that employs unidirectional data signaling, and yet allows such test equipment to test the SBD capability of such devices.

REFERENCES:
patent: 6163867 (2000-12-01), Miller et al.
patent: 6272657 (2001-08-01), Dhaliwal
patent: 6317352 (2001-11-01), Halbert et al.
patent: 6348811 (2002-02-01), Haycock et al.
patent: 6505317 (2003-01-01), Smith et al.
patent: 2002/0079926 (2002-06-01), Haycock et al.
patent: 07181227 (1995-07-01), None
patent: 0838689 (1998-04-01), None
patent: 07181227 (1995-07-01), None
English language abstract of Japanese Patent No. 07181227.

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