Method for producing a memory cell of a memory cell field in...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S268000

Reexamination Certificate

active

07005346

ABSTRACT:
A memory cell has a vertical construction of a capacitor and a vertical FET arranged above the latter which can be produced with a lower outlay and in a technologically more reliable fashion. This is achieved by virtue of the fact that two first trenches running parallel and having a first depth are etched in the semiconductor substrate. Between the trenches is formed a web, which is connected to the semiconductor substrate at its narrow sides and which is severed at its underside and is separated from the semiconductor substrate. The suspended web is then provided with a closed dielectric. After a filling, the FET is applied and connected to the web as memory node.

REFERENCES:
patent: 5907170 (1999-05-01), Forbes et al.
patent: 6156604 (2000-12-01), Forbes et al.
patent: 6165836 (2000-12-01), Forbes et al.
patent: 6503813 (2003-01-01), Koburger, III
patent: 6638812 (2003-10-01), Schlosser et al.
patent: 2001/0000918 (2001-05-01), Forbes et al.
patent: 2001/0001722 (2001-05-01), Forbes et al.
patent: 2002/0053889 (2002-05-01), Forbes et al.
patent: 101 11 760 (2002-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for producing a memory cell of a memory cell field in... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for producing a memory cell of a memory cell field in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing a memory cell of a memory cell field in... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3628445

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.