Method to form contactless array for high density nonvolatile me

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438263, H01L 218247

Patent

active

06033956&

ABSTRACT:
A method of forming contactless array for high density ROM. After floating gates and N.sup.+ buried bit lines are formed, LPD oxide is deposited over the N.sup.+ buried bit lines. Then, a thin oxide layer and a thin nitride layer are successively grown on the floating gates. Moreover, another oxidation process is performed to reoxidize the thin nitride film to become an oxynitride film. Next, a second N.sup.+ polysilicon layer is deposited to form control gates.

REFERENCES:
patent: 4720323 (1988-01-01), Sato
patent: 5472898 (1995-12-01), Hong et al.
patent: 5523251 (1996-06-01), Hong
patent: 5693551 (1997-12-01), Su et al.
patent: 5770501 (1998-06-01), Hong

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method to form contactless array for high density nonvolatile me does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method to form contactless array for high density nonvolatile me, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method to form contactless array for high density nonvolatile me will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-362399

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.