Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2006-05-09
2006-05-09
Deo, Duy-Vu N. (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S714000, C438S717000, C438S723000, C438S724000, C438S725000
Reexamination Certificate
active
07041602
ABSTRACT:
A method of fabricating a semiconductor device includes forming an interlayer insulating film on a semiconductor element; forming a polysilicon layer on the interlayer insulating film; implanting dopant atoms into the polysilicon layer; forming a resist layer on the polysilicon layer; forming one or more first openings in the resist layer; etching the polysilicon layer using the resist layer as a first mask, thereby forming one or more second openings in the polysilicon layer; and forming one or more contact holes in the interlayer insulating film using at least the polysilicon layer as a second mask.
REFERENCES:
patent: 5665203 (1997-09-01), Lee et al.
patent: 5913148 (1999-06-01), Hills
patent: 6008121 (1999-12-01), Yang et al.
patent: 6025273 (2000-02-01), Chen et al.
patent: 6696365 (2004-02-01), Kumar et al.
patent: 6706638 (2004-03-01), Yang et al.
patent: 6750086 (2004-06-01), Jinno et al.
patent: 3-104216 (1991-05-01), None
patent: 4-196315 (1992-07-01), None
patent: 5-29479 (1993-02-01), None
patent: 05-226278 (1993-09-01), None
patent: 05-251407 (1993-09-01), None
patent: 8-148567 (1996-06-01), None
patent: 08255905 (1996-10-01), None
patent: 10-56021 (1998-02-01), None
Deo Duy-Vu N.
Oki Electric Industry Co. Ltd.
Volentine Francos & Whitt PLLC
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