Method of chemically etching TiW and/or TiWN

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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Details

156656, 156664, 437183, 437192, 437246, H01L 2128, H01L 21308

Patent

active

047879580

ABSTRACT:
A method of chemically etching TiW and/or TiWN is described wherein the etching of a semiconductor substrate having a layers of TiWN, TiW and Au disposed between the substrate and a Au bump is performed with a 30% solution of hydrogen peroxide (H.sub.2 O.sub.2) at a temperature of approximately 90.degree. C.

REFERENCES:
patent: 3992235 (1976-11-01), Garbarini
patent: 4267012 (1981-05-01), Pierce et al.
patent: 4381215 (1983-04-01), Reynolds et al.
patent: 4443295 (1984-04-01), Radigan et al.
patent: 4491860 (1985-01-01), Lim
patent: 4597003 (1986-06-01), Aine et al.
patent: 4668335 (1987-05-01), Mockler et al.
patent: 4711701 (1987-12-01), McLevite

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