Integrated circuit having electrically isolatable test...

Details Integrated circuit having electrically isolatable test... Integrated circuit having electrically isolatable test...

2006-10-17

2006-10-17

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C257S048000

Reexamination Certificate

active

07124341

ABSTRACT:
Special test circuitry in an IC for wafer level testing selectively connects the specialized test circuitry to the functional circuitry during wafer test. Following wafer test the special test circuitry is electrically isolated from the functional circuitry and power supplies such that it does not load functional circuit signals nor consume power.

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patent: 10125747 (1998-05-01), None
“High-Speed Measuring System for Testing Mixed-Signal-LSlperformance and its Application to Digital-Noise Measurement” by Tsukada et al. IMTC Conference INSPEC Accession No. 4829534.
“Critical Parameters for High-Performance Dynamic Response Measurements” by Murray et al. International Test Conference Proceedings Publication Date: Sep. 10-14, 1990, pp. 462-471 INSPEC Accession No. 3976212.

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