Semiconductor device and test system therefor

Details Semiconductor device and test system therefor Semiconductor device and test system therefor

2006-07-18

2006-07-18

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S724000

Reexamination Certificate

active

07080302

ABSTRACT:
The present invention provides a test system for a semiconductor device, the test system comprising: a test data generator for generating test data, the test data generator being provided in an output section; a delay circuit for, in order to use as expected-value data the test data after the test data is transferred through inside a chip, adjusting a time difference between the test data and the expected-value data; a comparator for, against the expected-value data, comparing and verifying the test data after the test data is transferred outside the chip, the comparator being provided in an input section; and an external wiring for connecting an output pin connected to the test data generator and an input pin connected to the comparator.

REFERENCES:
patent: 5305331 (1994-04-01), Sato et al.
patent: 5400342 (1995-03-01), Matsumura et al.
patent: 5619512 (1997-04-01), Kawashima et al.
patent: 5621739 (1997-04-01), Sine et al.
patent: 5812562 (1998-09-01), Baeg
patent: 6275023 (2001-08-01), Oosaki et al.
patent: 6347387 (2002-02-01), Fischer
patent: 6466496 (2002-10-01), Kuge
patent: 6690154 (2004-02-01), Jones et al.
patent: 6694461 (2004-02-01), Treuer
patent: 6704897 (2004-03-01), Takagi
patent: 6708301 (2004-03-01), Ohta et al.
patent: 3117214 (1991-05-01), None

Affiliated with

Also associated with

Rating

Semiconductor device and test system therefor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and test system therefor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and test system therefor will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3613862