Semiconductor integrated circuit device having...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S263000

Reexamination Certificate

active

07071050

ABSTRACT:
A semiconductor memory device having nonvolatile memory cells each formed of a MISFET having both a floating gate and a control gate and first and second semiconductor regions serving as the source and drain regions, respectively. In accordance with the method of manufacture thereof, an impurity, for example, arsenic, is introduced to form both the first and second semiconductor regions but with the second semiconductor region having a lower dose thereof so that the first semiconductor region formed attains a junction depth greater than that of the second semiconductor region, and both the first and second semiconductor regions have portions thereof extending under the floating gate electrode. The device and method therefor further feature the formation of MISFETs of peripheral circuits.

REFERENCES:
patent: 3868187 (1975-02-01), Masuoka
patent: 4062699 (1977-12-01), Armstrong
patent: 4142926 (1979-03-01), Morgan
patent: 4258378 (1981-03-01), Wall
patent: 4290077 (1981-09-01), Ronen
patent: 4318216 (1982-03-01), Hsu
patent: 4376947 (1983-03-01), Chiu et al.
patent: 4382826 (1983-05-01), Pfleiderer et al.
patent: 4573144 (1986-02-01), Countryman, Jr.
patent: 4630085 (1986-12-01), Koyama
patent: 4642881 (1987-02-01), Matsukawa et al.
patent: 4651406 (1987-03-01), Shimizu et al.
patent: 4665418 (1987-05-01), Mizutani
patent: 4698787 (1987-10-01), Mukherjee et al.
patent: 4766088 (1988-08-01), Kono et al.
patent: 4784966 (1988-11-01), Chen
patent: 4804637 (1989-02-01), Smayling et al.
patent: 4835740 (1989-05-01), Sato
patent: 4851365 (1989-07-01), Jeuch
patent: 4859619 (1989-08-01), Wu et al.
patent: 4872041 (1989-10-01), Sugiura et al.
patent: 4972371 (1990-11-01), Komori et al.
patent: 4992389 (1991-02-01), Ogura et al.
patent: 5036018 (1991-07-01), Mazzali
patent: 5079603 (1992-01-01), Komori et al.
patent: 5153144 (1992-10-01), Komori et al.
patent: 5189497 (1993-02-01), Komori et al.
patent: 5300802 (1994-04-01), Komori et al.
patent: 5340760 (1994-08-01), Komori et al.
patent: 5352620 (1994-10-01), Komori et al.
patent: 5407853 (1995-04-01), Komori et al.
patent: 5472891 (1995-12-01), Komori et al.
patent: 5604142 (1997-02-01), Komori et al.
patent: 5629541 (1997-05-01), Komori et al.
patent: 5656522 (1997-08-01), Komori et al.
patent: 5656839 (1997-08-01), Komori et al.
patent: 5904518 (1999-05-01), Komori et al.
patent: 6451643 (2002-09-01), Komori et al.
patent: 0286121 (1988-10-01), None
patent: 53097381 (1978-08-01), None
patent: 54008988 (1979-01-01), None
patent: 54099531 (1979-08-01), None
patent: 54156483 (1979-12-01), None
patent: 56069866 (1981-06-01), None
patent: 59110158 (1984-06-01), None
patent: 60110171 (1985-06-01), None
patent: 60207385 (1985-10-01), None
patent: 61032478 (1986-02-01), None
patent: 62002570 (1987-01-01), None
patent: 62098765 (1987-05-01), None
patent: 61185363 (1987-08-01), None
patent: 62276878 (1987-12-01), None
patent: 0301566 (1988-12-01), None
patent: 0102073 (1992-06-01), None
patent: 63284587 (1999-03-01), None
AA Single Transistor EEPROM Cell and Its Implementation in a 512K CMOS EEPROM@, 1985, EEDM Tech. Dig., pp. 616-619, by S. Mukherjee et al.
IEEE Sponsored IEDM87 publication article entitled AA Flash-Erase EEPROM Cell with an Asymmetric Source and Drain Structure@, by H. Kume et al., IEDM 1987, 25.8, pp. 560-563.
A Design of an E2PROM Memory Cell Less Than 100 Square Microns Using 1 Micron Technology@, 1984 IEDM Tech. Dig., pp. 468-471, by S. Lai et al.

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