Semiconductor device and wiring forming method in...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S622000, C438S624000, C438S618000, C438S778000

Reexamination Certificate

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07074706

ABSTRACT:
The present invention provides a semiconductor device in which a problem such as a thermal diffusion defect in a hollow wiring technique can be solved. In the semiconductor device, a gap is formed between wirings formed on a substrate, and the gap is filled with a gas having a thermal conductivity equal to or higher than three times that of air at 0° C.

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patent: 6016000 (2000-01-01), Moslehi
patent: 6124198 (2000-09-01), Moslehi
patent: 6255712 (2001-07-01), Clevenger et al.
patent: 6284675 (2001-09-01), Jin et al.
patent: 6413852 (2002-07-01), Grill et al.
patent: 6472333 (2002-10-01), Xia et al.
patent: 6524429 (2003-02-01), Nogami et al.
patent: 6765297 (2004-07-01), Aoyama et al.

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