Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-04-11
2006-04-11
Le, Thao P. (Department: 2818)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S622000, C438S618000
Reexamination Certificate
active
07026241
ABSTRACT:
A semiconductor device comprising element regions formed in a semiconductor substrate, conductor plugs embedded in an interlayer insulation film, and wiring layers connected to the plugs, wherein the plugs are arranged on a straight line orthogonal to a longitudinal direction of the wiring layer in the same pitch as the wiring layers such that the straight line and upper surfaces of the plugs are superposed each other, and when the plugs are viewed in a cross section parallel to a main surface of the substrate and a distance which is between those two edge points of each of the plugs where a split line which passes through a center of each of the plugs passes is defined as a contact diameter, the contact diameter has three or more maximum values and three or more minimum values while the split line is rotated in the cross section by 360 degrees.
REFERENCES:
patent: 5734607 (1998-03-01), Sung et al.
patent: 6160297 (2000-12-01), Shimizu et al.
patent: 6411548 (2002-06-01), Sakui et al.
patent: 6440843 (2002-08-01), Wada et al.
patent: 6444570 (2002-09-01), Shibata
K. Ueno, et al. “A Quarter-Micron Planarized Interconnection Technology with Self-Aligned Plug,” IEDM Tech. Dig., 1992, pp. 305-308.
K. Ueno, et al. “A Half-Micron Pitch Cu Interconnection Technology,” VLSI Tech., Dig., 1995, pp. 27-28.
R.F. Schnabel, et al. “Slotted Vias for Dual Damascene Interconnects in 1Gb DRAMs,” VLSI Tech. Dig., 1999, pp. 43-44.
Goda Akira
Hazama Hiroaki
Noguchi Mitsuhiro
Takeuchi Yuji
Kabushiki Kaisha Toshiba
Le Thao P.
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