LDMOS device with isolation guard rings

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S337000, C257S343000, C257S409000, C257S122000, C257S126000

Reexamination Certificate

active

06924531

ABSTRACT:
A method of forming a LDMOS semiconductor device and structure for same. A preferred embodiment comprises forming a first guard ring around and proximate the drain of a LDMOS device, and forming a second guard ring around the first guard ring. The first guard ring comprises a P+ base guard ring, and the second guard ring comprises an N+ collector guard ring formed in a deep N-well, in one embodiment. The first guard ring and second guard ring prevent leakage current from flowing from the drain of the LDMOS device to the substrate.

REFERENCES:
patent: 6169309 (2001-01-01), Teggatz et al.
patent: 6468870 (2002-10-01), Kao et al.
patent: 6475870 (2002-11-01), Huang et al.
patent: 6486034 (2002-11-01), Huang et al.
patent: 6580131 (2003-06-01), Huang et al.
patent: 6593621 (2003-07-01), Tsuchiko et al.
patent: 6642551 (2003-11-01), Zommer
patent: 6727547 (2004-04-01), Brisbin et al.
patent: 6747294 (2004-06-01), Gupta et al.

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