Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-08-02
2005-08-02
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S337000, C257S343000, C257S409000, C257S122000, C257S126000
Reexamination Certificate
active
06924531
ABSTRACT:
A method of forming a LDMOS semiconductor device and structure for same. A preferred embodiment comprises forming a first guard ring around and proximate the drain of a LDMOS device, and forming a second guard ring around the first guard ring. The first guard ring comprises a P+ base guard ring, and the second guard ring comprises an N+ collector guard ring formed in a deep N-well, in one embodiment. The first guard ring and second guard ring prevent leakage current from flowing from the drain of the LDMOS device to the substrate.
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Chen Fu-Hsin
Liu Ruey-Hsin
Flynn Nathan J.
Forde Remmon R.
Slater & Matsil L.L.P.
Taiwan Semiconductor Manufacturing Company , Ltd.
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