Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-11-15
2005-11-15
Nguyen, Ha (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S198000, C438S275000, C438S287000, C438S296000, C438S299000, C438S303000, C438S592000
Reexamination Certificate
active
06964904
ABSTRACT:
The present invention discloses method for manufacturing semiconductor device employing an EXTIGATE structure. In accordance with the method, a predetermined thickness of the device isolation film is etched to form a recess. The recess is then filled with a second nitride film. A stacked structure of a barrier metal film, a metal layer and a third nitride film on the second nitride film and the polysilicon film is formed on the entire surface and the etched via a photoetching process to form a gate electrode. An insulating film spacer is deposited on a sidewall of the gate electrode. The exposed portion of the polysilicon film using the third nitride film pattern and the insulating film spacer as a mask to form a polysilicon film pattern and an oxide film on a sidewall of the polysilicon film pattern.
REFERENCES:
patent: 5963818 (1999-10-01), Kao et al.
patent: 6081662 (2000-06-01), Murakami et al.
patent: 6326263 (2001-12-01), Hsieh
patent: 6645798 (2003-11-01), Hu
patent: 2002/0052085 (2002-05-01), Hwang et al.
patent: 2004/0051153 (2004-03-01), Yamamoto et al.
Heller Ehrman LLP
Hynix / Semiconductor Inc.
Lee Cheung
Nguyen Ha
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