Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-11-29
2005-11-29
Smoot, Stephen W. (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S596000
Reexamination Certificate
active
06969655
ABSTRACT:
Methods of fabricating semiconductor devices are disclosed. An example method may include providing a substrate including an active region and a non-active region and forming a first gate electrode comprising a dielectric layer pattern, a first conducting layer pattern, and a first insulating layer pattern, the first gate electrode functioning as a flash memory. The example method may also include forming spacers on sidewalls of the first gate electrode; forming a second gate electrode comprising a gate oxide, a second conducting layer pattern, and a second insulating layer pattern, the second gate electrode functioning as a normal gate electrode; and removing a residual conducting layer on one sidewall of the spacer.
REFERENCES:
patent: 6001688 (1999-12-01), Rizzuto
patent: 6165845 (2000-12-01), Hsieh et al.
patent: 6232185 (2001-05-01), Wang
patent: 6284596 (2001-09-01), Sung et al.
patent: 6348378 (2002-02-01), Lee
patent: 6455440 (2002-09-01), Jeng
patent: 6589842 (2003-07-01), Huang
patent: 6642116 (2003-11-01), Lin
patent: 2002-026159 (2002-01-01), None
DongbuAnam Semiconductor Inc.
Hanley Flight & Zimmerman, LLC.
Smoot Stephen W.
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