Resist compositions with polymers having 2-cyano acrylic...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface

Reexamination Certificate

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C430S311000, C430S313000, C430S314000, C430S324000

Reexamination Certificate

active

06902874

ABSTRACT:
Acid-catalyzed positive resist compositions which are imageable with 193 nm radiation and/or possibly other radiation and are developable to form resist structures of improved development characteristics and improved etch resistance are enabled by the use of resist compositions containing imaging polymer having a 2-cyano acrylic monomer.

REFERENCES:
patent: 6627391 (2003-09-01), Ito et al.
patent: 2002/0187419 (2002-12-01), Dammel et al.

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