Methods of forming metal-containing layers including a metal...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S654000, C438S685000, C438S785000

Reexamination Certificate

active

06951813

ABSTRACT:
The invention includes methods of forming metal-containing layers. The layers can, in particular aspects, consist essentially of metal, or consist of metal. The desired layers can be formed by initially depositing a metal-containing layer which comprises metal and halogen atoms. Subsequently, trialkylaluminum is utilized to remove the halogen atoms from the layer. The layer remaining after removal of the halogen atoms can comprise, consist essentially, or consist of any suitable metal, and in particular aspects can consist essentially of, or consist of, titanium or titanium/aluminum.

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“Growth Kinetics and initial stage growth during plasma-enhanced Ti aromic deposition”; H. Kim and S. M. Rossnagel; J. Vac. Sci. Technol. A20(3) May/Jun. 2002; American Vacuum Society; pp. 802-808.
“Trimethylaluminum as a Reducing Agent in the Atomic Layer Deposition of Ti(11)N Thin Films”; Marika Juppo, Petra Alen, Mikko Ritala, and Markku Leskel s; Chem. Vap. Deposition 2001, 7, No. 5; pp. 211-217.

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