Method for cleaning plasma enhanced chemical vapor...

Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C134S022100, C134S022180, C134S031000, C134S902000, C438S905000

Reexamination Certificate

active

06932092

ABSTRACT:
A method for cleaning a plasma enhanced chemical vapor deposition chamber. The method includes introducing a cleaning gas into the plasma enhanced chemical vapor deposition chamber, forming a plasma using a very high frequency (VHF) power having a frequency in a range from about 20 MHz to about 100 MHz, and reacting the cleaning gas with deposits within the chamber in the presence of the plasma.

REFERENCES:
patent: 4786352 (1988-11-01), Benzing
patent: 5000113 (1991-03-01), Wang et al.
patent: 5294858 (1994-03-01), Nakahata et al.
patent: 5463978 (1995-11-01), Larkin et al.
patent: 5466728 (1995-11-01), Babcock et al.
patent: 5556501 (1996-09-01), Collins et al.
patent: 5627079 (1997-05-01), Gardella, Jr. et al.
patent: 5656123 (1997-08-01), Salimian et al.
patent: 5707486 (1998-01-01), Collins et al.
patent: 5824607 (1998-10-01), Trow et al.
patent: 5843239 (1998-12-01), Shrotriya
patent: 5882424 (1999-03-01), Taylor et al.
patent: 5886067 (1999-03-01), Li et al.
patent: 5905117 (1999-05-01), Yokotsuka et al.
patent: 5935374 (1999-08-01), Ito et al.
patent: 6054379 (2000-04-01), Yau et al.
patent: 6068729 (2000-05-01), Shrotriya
patent: 6099747 (2000-08-01), Usami
patent: 6103781 (2000-08-01), Li et al.
patent: 6142096 (2000-11-01), Sakai et al.
patent: 6238751 (2001-05-01), Mountsier
patent: 6287943 (2001-09-01), Fujioka et al.
patent: 6287990 (2001-09-01), Cheung et al.
patent: 6312793 (2001-11-01), Grill et al.
patent: 6340628 (2002-01-01), Van Cleemput et al.
patent: 6346177 (2002-02-01), Leiphart
patent: 6352945 (2002-03-01), Matsuki et al.
patent: 6383955 (2002-05-01), Matsuki et al.
patent: 6410102 (2002-06-01), Hashizume et al.
patent: 6410463 (2002-06-01), Matsuki
patent: 6525144 (2003-02-01), Tanahashi et al.
patent: 6531193 (2003-03-01), Fonash et al.
patent: 6596627 (2003-07-01), Mandal
patent: 6767836 (2004-07-01), San et al.
patent: 6797643 (2004-09-01), Rocha-Alvarez et al.
patent: 2001/0021590 (2001-09-01), Matsuki et al.
patent: 2001/0051308 (2001-12-01), Kawamura et al.
patent: 2002/0001924 (2002-01-01), Fujioka et al.
patent: 2002/0016085 (2002-02-01), Huang et al.
patent: 2002/0197849 (2002-12-01), Mandal
patent: 2003/0008155 (2003-01-01), Hayashi et al.
patent: 2003/0022468 (2003-01-01), Shioya et al.
patent: 2003/0022519 (2003-01-01), Fujioka et al.
patent: 0 520 519 (1992-12-01), None
patent: 9 320 966 (1997-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for cleaning plasma enhanced chemical vapor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for cleaning plasma enhanced chemical vapor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for cleaning plasma enhanced chemical vapor... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3459906

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.