Context save and restore using test scan chains

Details Context save and restore using test scan chains Context save and restore using test scan chains

2005-10-25

2005-10-25

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

06959407

ABSTRACT:
A method for providing context save and restore using a test scan chain is provided. The method includes dividing a scan chain (34) of digital logic components (24) into a plurality of sub-chains (42). A first data set is provided in the sub-chains (42). The sub-chains (42) are linked in parallel and to a hardware resource for executing an application. The sub-chains (42) are linked to a device memory (18). A first application is executed to update the first data set in the sub-chains (42). The first application is operable to use the hardware resource. The updated first data set is stored in the device memory (18). A second data set is restored from the device memory (18) to the sub-chains (42). A second application is executed to update the second data set in the sub-chains (42). The second application is operable to use the hardware resource.

REFERENCES:
patent: 6237054 (2001-05-01), Freitag, Jr.
patent: 6370664 (2002-04-01), Bhawmik
patent: 6715105 (2004-03-01), Rearick
patent: 2002/0125907 (2002-09-01), Kurtulik et al.
Brown, Chuck, et al., “Reconfigurable Digital Baseband Modulation for Wireless Computer Communication,” 1995 IEEE. pp. 610-616.

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