Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
Reexamination Certificate
2005-04-12
2005-04-12
Cuneo, Kamand (Department: 2813)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Thinning of semiconductor substrate
C438S455000, C438S464000, C438S458000, C438S637000, C438S639000, C438S672000, C438S689000
Reexamination Certificate
active
06878608
ABSTRACT:
A silicon based package (SBP) is formed starting with a thick wafer, which serves as the base for the SBP, composed of silicon which has a first surface and a reverse surface which are planar. Then form an interconnection structure including multilayer conductor patterns over the first surface. Form a temporary bond between the SBP and a wafer holder, with the wafer holder being a rigid structure. Thin the wafer to a desired thickness to form an Ultra Thin Silicon Wafer (UTSW) for the SBP. Forming via holes which extend through the UTSW, forming metallization in the via holes which extends through the UTSW, making electrical contact to the interconnection structure on the first surface. Then bond the metallization in the via holes to pads of a carrier.
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Brofman Peter J.
Daves Glenn G.
Ray Sudipta K.
Stoller Herbert I.
Blecker Ira D.
Cuneo Kamand
Jones II Graham S.
Mitchell James M.
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