Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-03-22
2005-03-22
Smith, Matthew (Department: 2825)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S259000, C438S270000, C438S268000
Reexamination Certificate
active
06869848
ABSTRACT:
A method of manufacturing a flash memory device, in which a spike annealing is performed after an ion implantation for controlling a threshold voltage. Therefore, it is possible to obtain a uniform and stabilized doping profile for controlling a threshold voltage, to use BF2ions as a dose for controlling a threshold voltage to obtain a shallow channel junction, to obtain different doping profiles in the channel junction depending on the process conditions and the atmosphere in the spike annealing equipment, and to control a doping profile for controlling a threshold voltage.
REFERENCES:
patent: 6087222 (2000-07-01), Jung Lin et al.
patent: 6124608 (2000-09-01), Liu et al.
patent: 20030094636 (2003-05-01), Maeda
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
Smith Matthew
Yevsikov Victor V
LandOfFree
Method of manufacturing flash memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of manufacturing flash memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing flash memory device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3414220