Method and apparatus for programmable logic device (PLD)...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C326S039000, C326S038000, C716S030000

Reexamination Certificate

active

06839873

ABSTRACT:
According to one embodiment, a programmable logic assembly (200) may include a nonvolatile memory (202) may be coupled to an associated volatile programmable logic device (PLD) (204). Built-in-self-test (BIST) data (208) may be stored in a nonvolatile memory (202) that places the volatile PLD (204) in a self-test configuration. If a volatile PLD (204) passes a self-test, user data (210) may be stored in a nonvolatile memory (202) that places a volatile PLD (204) into a user determined configuration.

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