Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-05-31
2005-05-31
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S775000
Reexamination Certificate
active
06900096
ABSTRACT:
The present invention relates to a method of manufacturing a flash memory cell capable of preventing an oxidation of a dielectric film between a floating gate and a control gate, in a manner that a polysilicon film for floating gate is deposited, nitrogen ions are injected to make amorphous and contaminate the surface of the polysilicon film.
REFERENCES:
patent: 5631179 (1997-05-01), Sung et al.
patent: 5814862 (1998-09-01), Sung et al.
patent: 6054733 (2000-04-01), Doan et al.
patent: 6396099 (2002-05-01), Joo et al.
patent: 6529410 (2003-03-01), Han et al.
Dong Cha Deok
Park Sang Wook
Hynix / Semiconductor Inc.
Mayer Brown Rowe & Maw LLP
Nhu David
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