Process for low temperature atomic layer deposition of RH

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S239000, C438S253000, C438S393000, C438S680000, C438S686000

Reexamination Certificate

active

06943073

ABSTRACT:
A method for the formation of rhodium films with good step coverage is disclosed. Rhodium films are formed by a low temperature atomic layer deposition technique using a first gas of rhodium group metal precursor followed by an oxygen exposure. The invention provides, therefore, a method for forming smooth and continuous rhodium films which also have good step coverage and a reduced carbon content.

REFERENCES:
patent: 5563290 (1996-10-01), Ito
patent: 6204178 (2001-03-01), Marsh
patent: 6270572 (2001-08-01), Kim et al.
patent: 6323511 (2001-11-01), Marsh
patent: 6358829 (2002-03-01), Yoon et al.
patent: 6387802 (2002-05-01), Marsh
patent: 6482740 (2002-11-01), Soininen et al.
patent: 6617206 (2003-09-01), Sandhu et al.
patent: 2002/0081381 (2002-06-01), DelaRosa et al.
patent: 2002/0110991 (2002-08-01), Li

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