Method of fabricating flash memory device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S586000

Reexamination Certificate

active

07381617

ABSTRACT:
A method of fabricating flash memory devices includes the steps of forming a stop nitride film and an oxide film on a semiconductor substrate having a predetermined structure formed therein, forming trenches in the oxide film and the stop nitride film, forming barrier oxide films on lateral faces of the trenches by an atomic layer deposition method, and forming bit lines within the trenches.

REFERENCES:
patent: 2002/0060334 (2002-05-01), Shukuri et al.
patent: 2006/0194385 (2006-08-01), Hong
patent: 2007/0238286 (2007-10-01), Kwon
patent: 2006-245538 (2006-09-01), None
patent: 1020010077260 (2001-08-01), None

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