Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-08
2008-07-08
Pham, Hoai V (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S315000, C257SE29129, C257SE29300, C257SE21179, C257SE21680, C438S201000, C438S257000
Reexamination Certificate
active
07397079
ABSTRACT:
A non-volatile memory device includes a control gate electrode disposed on a substrate with a first insulation layer interposed therebetween and a floating gate disposed in a hole exposing substrate through the control gate electrode and the first insulation layer. A second insulation layer is interposed between the floating gate and the substrate, and between the floating gate and the control gate.
REFERENCES:
patent: 5455793 (1995-10-01), Amin et al.
patent: 7276759 (2007-10-01), Yu et al.
patent: 09-064208 (1997-03-01), None
patent: 10-0390889 (2003-07-01), None
patent: 10-2004-0049874 (2004-06-01), None
Choi Yong-Suk
Kim Jin-woo
Kim Yong-Tae
Yoon Seung-Beom
F. Chau & Associates LLC.
Pham Hoai v
Samsung Electronics Co,. Ltd.
LandOfFree
Non-volatile memory device and methods of forming the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Non-volatile memory device and methods of forming the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-volatile memory device and methods of forming the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2776027