Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-07-29
2008-07-29
Chaudhari, Chandra (Department: 2891)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S981000, C257SE21639
Reexamination Certificate
active
07405118
ABSTRACT:
The present invention provides a semiconductor device fabrication method including the steps of: forming first gate insulating films in first to third active regions of a silicon substrate; wet-etching the first gate insulating film of the second active region through a first resist opening portion of a first resist pattern; forming a second gate insulating film in the second active region; forming on the silicon substrate a second resist pattern having a second resist portion larger than the first resist opening portion; wet-etching the first gate insulating film of the third active region through a second resist opening portion of the second resist pattern; and forming a third gate insulating film in the third active region.
REFERENCES:
patent: 6165825 (2000-12-01), Odake
patent: 6403425 (2002-06-01), Ang et al.
patent: 6831020 (2004-12-01), Yamada et al.
patent: 2003-203988 (2003-07-01), None
Chaudhari Chandra
Fujitsu Limited
Westerman, Hattori, Daniels & Adrian , LLP.
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