Sample operation apparatus

Details Sample operation apparatus Sample operation apparatus

2011-01-11

2011-01-11

Raevis, Robert R (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

07866205

ABSTRACT:
There is provided a sample operation apparatus in which, by a static electricity force acting between a probe and a sample, an accurate position is gripped without the sample being moved, and the sample can be operated by the probe for an observation, a grip, a release, or the like. In a casing body capable of being sealed, there are installed a sample operation tweezers comprising an observation probe and a grip probe, and a sample base fixing a substrate on which the sample is mounted. By the facts that a surface of the substrate is treated such that its hydrophilic nature is higher than the sample operation tweezers, and that a humidity in the casing body is controlled by a humidity control device, there is made such that an actuation of a grip, a movement, a separation or the like of the sample is performed under a state in which water films are formed on the sample, the substrate and a surface of the sample operation tweezers.

REFERENCES:
patent: 7375325 (2008-05-01), Burkhardt et al.
patent: 2005/0145021 (2005-07-01), Chand et al.
patent: 2008/0149832 (2008-06-01), Zorn
Takekawa et al., “Development in AFM tweezers for performing manipulation of nanomatter”, Denki Gakkai Ronbunshi, E. Trans. SM, vol. 125, No. 11, pp. 448-453 2005.

Affiliated with

Also associated with

Rating

Sample operation apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sample operation apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sample operation apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2741291