Flash memory device and manufacturing method of the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S400000, C438S238000, C438S239000, C438S386000, C438S389000, C257S324000, C257SE21679, C257SE27103, C257S295000, C257S296000, C257S314000, C257SE21209

Reexamination Certificate

active

07932147

ABSTRACT:
A flash memory device may include a device isolation layer and an active area formed over a semiconductor substrate, a memory gate formed over the active area, and a control gate formed over the semiconductor substrate including the memory gate, wherein the active area, where a source contact is to be formed, has the same interval spacing as a bit line, and a common source line area, where the source contact is to be formed, has an impurity area connecting neighboring active areas.

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