Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-07-05
2011-07-05
Vu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE27103, C257SE29300, C438S211000
Reexamination Certificate
active
07973354
ABSTRACT:
A gate pattern is disclosed that includes a semiconductor substrate, a lower conductive pattern, an upper conductive pattern, and a sidewall conductive patter. The lower conductive pattern is on the substrate. The insulating pattern is on the lower conductive pattern. The upper conductive pattern is on the insulating pattern opposite to the lower conductive pattern. The sidewall conductive pattern is on at least a portion of sidewalls of the upper conductive pattern and the lower conductive pattern. The sidewall conductive pattern electrically connects the upper conductive pattern and the lower conductive pattern. An upper edge portion of the lower conductive pattern may be recessed relative to a lower edge portion of the lower conductive pattern to define a ledge thereon. The sidewall conductive pattern may be directly on the ledge and sidewall of the recessed upper edge portion of the lower conductive pattern.
REFERENCES:
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patent: 5023679 (1991-06-01), Shibata
patent: 6221717 (2001-04-01), Cremonesi et al.
patent: 7012295 (2006-03-01), Sato et al.
patent: 2004/0026748 (2004-02-01), Goda et al.
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Notice to File a Response/Amendment to the Examination Report, Korean Application No. 10-2004-0089435, Mar. 27, 2006.
Choi Jung-dal
Lee Joon-hee
Sel Jong-Sun
Shin Hwa-Kyung
Myers Bigel & Sibley Sajovec, PA
Samsung Electronics Co,. Ltd.
Vu David
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