Process for creating vias using pillar technology

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438631, 438669, 438637, H01L 2144

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active

058010939

ABSTRACT:
A process for creating metal pillar via structures, used to interconnect multilevel metallizations, has been developed. The process features the creation of a via hole, in a thin dielectric layer, exposing the top surface of an underlying first level metallization structure. The metal pillar via structure is next formed, contacting the first level metallization structure, exposed in the opened via hole in the thin dielectric layer. The spaces between the metal pillar via structures are filled with a composite dielectric material, featuring a spin on glass layer, which provides partial planarazation. The planarazation process is completed via a chemical mechanical polishing process, which also exposes the top surface of the metal pillar via structure, making the metal pillar via structure easily accessible for contact for subsequent, overlying metallization structures.

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