Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent
1996-06-13
1998-09-01
Everhart, Caridad
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
438631, 438669, 438637, H01L 2144
Patent
active
058010939
ABSTRACT:
A process for creating metal pillar via structures, used to interconnect multilevel metallizations, has been developed. The process features the creation of a via hole, in a thin dielectric layer, exposing the top surface of an underlying first level metallization structure. The metal pillar via structure is next formed, contacting the first level metallization structure, exposed in the opened via hole in the thin dielectric layer. The spaces between the metal pillar via structures are filled with a composite dielectric material, featuring a spin on glass layer, which provides partial planarazation. The planarazation process is completed via a chemical mechanical polishing process, which also exposes the top surface of the metal pillar via structure, making the metal pillar via structure easily accessible for contact for subsequent, overlying metallization structures.
REFERENCES:
patent: 4917759 (1990-04-01), Fisher et al.
patent: 5262354 (1993-11-01), Cote et al.
patent: 5312512 (1994-05-01), Allman et al.
patent: 5616519 (1997-04-01), Ping
patent: 5639692 (1997-06-01), Teong
patent: 5663108 (1997-09-01), Lin
Ackerman Stephen B.
Everhart Caridad
Saile George O.
Taiwan Semiconductor Manufacturing Company , Ltd.
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