Light weight and high throughput test case generation...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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C714S035000

Reexamination Certificate

active

07966521

ABSTRACT:
A test case manager selects a first test case and a second test case from a plurality of test cases. The test case manager provides the first test case to a first processor and provides the second test case to a second processor. As such, the first processor executes the first test case and the second processor executes the second test case. After the execution, the test case manager loads the first test case onto the second processor and loads the second test case onto the first processor. In turn, the first processor executes the second test case and the second processor executes the first test case.

REFERENCES:
patent: 4357656 (1982-11-01), Saltz et al.
patent: 4800486 (1989-01-01), Horst et al.
patent: 5068783 (1991-11-01), Tanagawa et al.
patent: 5488573 (1996-01-01), Brown et al.
patent: 6006028 (1999-12-01), Aharon et al.
patent: 6182246 (2001-01-01), Gregory et al.
patent: 6560721 (2003-05-01), Boardman et al.
patent: 6684359 (2004-01-01), Noy
patent: 6871298 (2005-03-01), Cavanaugh et al.
patent: 6966017 (2005-11-01), Evans
patent: 7010734 (2006-03-01), Brahme et al.
patent: 7133816 (2006-11-01), Adir et al.
patent: 7222179 (2007-05-01), Srivastava et al.
patent: 7240243 (2007-07-01), Decker
patent: 7457989 (2008-11-01), Ulrich et al.
patent: 7590973 (2009-09-01), Barry et al.
patent: 7669083 (2010-02-01), Arora et al.
patent: 7752499 (2010-07-01), Choudhury et al.
patent: 7836343 (2010-11-01), Feng et al.
patent: 2004/0078699 (2004-04-01), Thompson et al.
patent: 2004/0123185 (2004-06-01), Pierce et al.
patent: 2006/0015689 (2006-01-01), Okawa et al.
patent: 2007/0168733 (2007-07-01), Devins et al.
patent: 2008/0141080 (2008-06-01), Bohizic et al.
patent: 2008/0141084 (2008-06-01), Bohizic et al.
patent: 2008/0216076 (2008-09-01), Udell et al.
patent: 2008/0288834 (2008-11-01), Manovit et al.
patent: 2008/0320352 (2008-12-01), Udell et al.
patent: 2009/0070631 (2009-03-01), Arora et al.
patent: 2009/0070632 (2009-03-01), Bag et al.
patent: 2009/0222647 (2009-09-01), Feng et al.

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