Nonvolatile semiconductor memory device having element...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S266000, C257SE21691

Reexamination Certificate

active

07939406

ABSTRACT:
Disclosure is semiconductor device of a selective gate region, comprising a semiconductor layer, a first insulating film formed on the semiconductor layer, a first electrode layer formed on the first insulating layer, an element isolating region comprising an element isolating insulating film formed to extend through the first electrode layer and the first insulating film to reach an inner region of the semiconductor layer, the element isolating region isolating a element region and being self-aligned with the first electrode layer, a second insulating film formed on the first electrode layer and the element isolating region, an open portion exposing a surface of the first electrode layer being formed in the second insulating film, and a second electrode layer formed on the second insulating film and the exposed surface of the first electrode layer, the second electrode layer being electronically connected to the first electrode layer via the open portion.

REFERENCES:
patent: 4780431 (1988-10-01), Maggioni et al.
patent: 5326999 (1994-07-01), Kim et al.
patent: 5793081 (1998-08-01), Tomioka et al.
patent: 6221717 (2001-04-01), Cremonesi et al.
patent: 6327179 (2001-12-01), Osari
patent: 6342715 (2002-01-01), Shimizu et al.
patent: 6420754 (2002-07-01), Takahashi et al.
patent: 6461916 (2002-10-01), Adachi et al.
patent: 6534867 (2003-03-01), Kamiya et al.
patent: 6661052 (2003-12-01), Matsui et al.
patent: 6713834 (2004-03-01), Mori et al.
patent: 6720612 (2004-04-01), Takeuchi et al.
patent: 6784503 (2004-08-01), Shimizu et al.
patent: 6794708 (2004-09-01), Mori
patent: 6835987 (2004-12-01), Yaegashi
patent: 6853029 (2005-02-01), Ichige et al.
patent: 6979860 (2005-12-01), Miwa
patent: 7061044 (2006-06-01), Park et al.
patent: 2003/0030123 (2003-02-01), Ichige et al.
patent: 2005/0082602 (2005-04-01), Okajima
patent: 0 255 159 (1988-02-01), None
patent: 2-1176 (1990-01-01), None
patent: 3-283570 (1991-12-01), None
patent: 6-125090 (1994-05-01), None
patent: 11-026731 (1999-01-01), None
patent: 11-97652 (1999-04-01), None
patent: 11-163304 (1999-06-01), None
patent: 11-186379 (1999-07-01), None
patent: 2000-183308 (2000-06-01), None
patent: 2000-223596 (2000-08-01), None
patent: 2000-243937 (2000-09-01), None
patent: 2000-269468 (2000-09-01), None
U.S. Appl. No. 12/560,783, filed Sep. 16, 2009, Murata, et al.

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