Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1996-07-26
1997-04-08
Gonzalez, Frank
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356373, 369 13, 360114, 360103, G01B 1100
Patent
active
056193319
ABSTRACT:
A monitor and method for monitoring the optical properties of a recording head of a hard disk drive. The monitor includes a light source that reflects a light beam off of the recording head. The reflected light beam is detected by a photodetector. The light beam directed onto the head has an intensity Ii. The light beam reflected from the head has an intensity Io. The photodetector and light source are coupled to a controller which calculates a reflectance R based on the ratio of the intensities Ii and Io. The reflectance R is a function of the optical properties of the recording head. The calculated reflectance R is compared with a threshold value. If the reflectance R exceeds the threshold value the monitor may provide a part fail message which indicates that the optical properties off a particular head deviates from a range of values. The present invention provides a means to quickly monitor the optical properties of recording heads without actually measuring the properties.
REFERENCES:
patent: 4493554 (1985-01-01), Pryor et al.
patent: 5247493 (1993-09-01), Kime et al.
Gonzalez Frank
Ratliff Reginald A.
SamSung Electronics, Ltd.
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