Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent
1997-05-13
2000-04-18
Booth, Richard
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
438286, 438162, 438528, H01L 2144
Patent
active
060514949
ABSTRACT:
A semiconductor device in which parasitic resistance of source/drain regions can be reduced than the parasitic resistance of the drain region, and manufacturing method thereof, can be obtained. In the semiconductor device, inactivating ions are implanted only to the source region of the semiconductor layer, so as to damage the crystal near the surface of the semiconductor layer, whereby siliciding reaction is promoted. Therefore, in the source region, a titanium silicide film which is thicker can be formed.
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Inoue Yasuo
Iwamatsu Toshiaki
Nishimura Tadashi
Yamaguchi Yasuo
Booth Richard
Mitsubishi Denki & Kabushiki Kaisha
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