Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1997-09-25
2000-04-18
Dang, Trung
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438424, 438294, 438688, 148DIG50, H01L 21336
Patent
active
060514728
ABSTRACT:
A semiconductor device of the present invention and using trench isolation includes contact holes. Spacers are formed on the shoulder portions of a device region exposed in the contact holes. To form the spacers, a silicon oxide film is formed and then etched by anisotropic etching such that the film does not fill up the contact holes. The anisotropic etching may be effected after oxidation. With this structure, it is possible to prevent junction leakage current from increasing.
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C. G. Jambotkar, "FET Structure", IBM Technical Disclosure Bulletin, vol. 24. No. 1A, Jun. 1981.
Abiko Hitoshi
Sakai Isami
Dang Trung
NEC Corporation
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