Low voltage electro-static discharge protective device and metho

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438281, 438947, H01L 21336

Patent

active

058858750

ABSTRACT:
A low voltage electro-static discharge protective device includes a field oxide layer on a substrate, source/drain regions beside the field oxide layer in the substrate, and a threshold voltage adjustment region under the field oxide layer. The fabricating of the protective device includes forming a pad oxide layer and a silicon nitride layer on a substrate, etching the silicon nitride layer to form an opening, forming a oxide spacer on the exposed portion of the pad oxide layer around the periphery of the opening, implanting ions into the substrate, forming a field oxide layer in the opening, so that the certain type of ions form a threshold voltage adjustment region under the field oxide layer, removing the silicon nitride layer, removing the exposed pad oxide layer, and forming source/drain regions beside the field oxide layer.

REFERENCES:
patent: 5489792 (1996-02-01), Hu et al.
patent: 5610089 (1997-03-01), Iwai et al.
patent: 5679602 (1997-10-01), Lin et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Low voltage electro-static discharge protective device and metho does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Low voltage electro-static discharge protective device and metho, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Low voltage electro-static discharge protective device and metho will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2124723

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.