X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1987-04-20
1989-04-04
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 58, 378 44, 250302, G01N 23201
Patent
active
048192562
ABSTRACT:
A method of imaging for enhancing detection of cracks or flaws in an object using penetrating radiation is disclosed wherein a contrast medium is applied to an object before illumination and scatter radiation is detected from the object. This is achieved by employing a flying spot scanner and a backscatter imaging technique allowing imaging of objects which are not completely accessible, e.g. imaging the object where only one side accessible.
REFERENCES:
patent: Re28544 (1975-09-01), Stein et al.
patent: 3197638 (1965-07-01), Sinclair
patent: 3351760 (1967-11-01), Brown
patent: 3704370 (1972-11-01), Shelton
patent: 3965353 (1976-06-01), Macovski
patent: 3974386 (1976-08-01), Mistretta et al.
patent: 4172224 (1979-10-01), Lapinski et al.
patent: 4178513 (1979-12-01), Dubois
patent: 4227081 (1980-10-01), Caputo et al.
patent: 4323973 (1982-04-01), Greenfield
patent: 4355331 (1982-10-01), Georges et al.
patent: 4400618 (1983-08-01), Bupp et al.
patent: 4577337 (1986-03-01), Light
patent: 4591478 (1986-05-01), Cohen et al.
patent: 4618928 (1986-10-01), Honda et al.
patent: 4621193 (1986-11-01), Van Hoye
patent: 4686694 (1987-08-01), Berry et al.
Stein et al., "Flying Spot X-Ray Imaging Systems", Materials Evaluation, vol. 30, No. 7, Jul. 1972, p. 137 et seq.
Annis Martin
Bjorkholm Paul
American Science and Engineering, Inc.
Fields Carolyn E.
Hynds Joseph A.
LandOfFree
Radiographic sensitivity for detection of flaws and cracks does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Radiographic sensitivity for detection of flaws and cracks, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Radiographic sensitivity for detection of flaws and cracks will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-186058