Plasma developable negative resist compositions for electron bea

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface

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430311, 430330, 430282, 430281, 430909, 430914, 430921, 430925, 156643, G03C 516

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active

046578447

ABSTRACT:
A negative resist composition including a polymeric matrix material, a polymerizable monomer, and an onium salt radiation sensitive initiator. The monomer is polymerized by irradiating the resist with an e-beam, x-ray, or ultraviolet source and heating the exposed resist. The resist is developed by a dry etchant such as plasma or a reactive ion etchant.

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patent: 4278753 (1981-07-01), Crivello
patent: 4423136 (1983-12-01), Crivello et al.

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