Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent
1998-11-12
2000-06-27
Bowers, Charles
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
438658, H01L 2144
Patent
active
060806672
ABSTRACT:
A titanium nitride film is formed on a silicon substrate having a contact hole formed therein by chemical vapor deposition and silicon ions are injected. Therefore, it is possible to reduce the film stress of the titanium nitride film, caused by the chemical vapor deposition, to the semiconductor device.
REFERENCES:
patent: 5885896 (1999-03-01), Thakur et al.
patent: 5940726 (1999-08-01), Yu
patent: 5960319 (1999-09-01), Iwata et al.
Bowers Charles
NEC Corporation
Pert Evan
LandOfFree
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