Coating apparatus – Gas or vapor deposition – With treating means
Patent
1997-05-01
1999-05-18
Breneman, R. Bruce
Coating apparatus
Gas or vapor deposition
With treating means
118723R, 156345, C23C16/00
Patent
active
059047801
ABSTRACT:
In a plasma etching apparatus, an inactive gas and a reactive gas are supplied from gas spouting holes into a process chamber, and are turned into plasma by means of RF discharge, so that a semiconductor wafer placed on a susceptor is etched by the plasma. An antenna formed of a solenoidal coil is arranged around the side wall of the process chamber, so as to generate an RF inductive electric field in the process chamber. A plurality of barriers are arranged to extend into the skin-depth region of the plasma from the side wall of the process chamber, so as to limit a mean free path of electrons in the skin-depth region. The barriers decrease density of low energy electrons in the skin depth region, so as to suppress progress of dissociation of the reactive gas, thereby obtaining a predetermined etching selectivity.
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Alejandro Luz L.
Breneman R. Bruce
Tokyo Electron Limited
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