Plasma processing apparatus

Coating apparatus – Gas or vapor deposition – With treating means

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118723R, 156345, C23C16/00

Patent

active

059047801

ABSTRACT:
In a plasma etching apparatus, an inactive gas and a reactive gas are supplied from gas spouting holes into a process chamber, and are turned into plasma by means of RF discharge, so that a semiconductor wafer placed on a susceptor is etched by the plasma. An antenna formed of a solenoidal coil is arranged around the side wall of the process chamber, so as to generate an RF inductive electric field in the process chamber. A plurality of barriers are arranged to extend into the skin-depth region of the plasma from the side wall of the process chamber, so as to limit a mean free path of electrons in the skin-depth region. The barriers decrease density of low energy electrons in the skin depth region, so as to suppress progress of dissociation of the reactive gas, thereby obtaining a predetermined etching selectivity.

REFERENCES:
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patent: 5113790 (1992-05-01), Geisler et al.
patent: 5527394 (1996-06-01), Heinrich et al.
patent: 5556501 (1996-09-01), Collins et al.
patent: 5591493 (1997-01-01), Paranjpe et al.
patent: 5683548 (1997-11-01), Hartig et al.

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