High-speed non-contact measuring apparatus for gauging the thick

Details High-speed non-contact measuring apparatus for gauging the thick High-speed non-contact measuring apparatus for gauging the thick

1998-08-26

2000-03-14

Kim, Robert H.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

356382, G01B 1106

Patent

active

060380284

ABSTRACT:
An optical measurement apparatus is provided for measuring the thickness of a moving sheet material (18). The apparatus has a pair of optical measurement systems (21, 31) attached to opposing surfaces (14, 16) of a rigid support structure (10). A pair of high-power laser diodes (20,30) and a pair of photodetector arrays (22,32) are attached to the opposing surfaces. Light emitted from the laser diodes is reflected off of the sheet material surfaces (17, 19) and received by the respective photodetector arrays. An associated method for implementing the apparatus is also provided.

REFERENCES:
patent: 5210593 (1993-05-01), Kramer
patent: 5581353 (1996-12-01), Taylor
Gopel, W., Hesse, J. and Zemel, J.N., A Comprehensive Survey, vol. 6, Optical Sensors, 1992, pp. 566-570.

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