Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

1998-03-19

2000-07-25

Chung, Phung M.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714724, G01R 3128

Patent

active

060947365

ABSTRACT:
A semiconductor integrated circuit device having a CPU or a logic circuit 4, a DRAM 2, and a plurality of selectors 8 mounted on a semiconductor chip. The selectors 8 are formed on a wiring 5 including a plurality of lines through which the CPU or the logic circuit 4 is connected to the DRAM 2. According to a control signal received through a wiring 6, a wiring 7 for transferring test patterns is connected to the DRAM 2, or the CPU or the logic circuit 4 is connected to the DRAM 2.

REFERENCES:
patent: 5848075 (1998-12-01), Katayama et al.
patent: 5903579 (1999-05-01), Osawa et al.
patent: 5905737 (1999-05-01), Osawa et al.

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