Low temperature aluminum reflow for multilevel metallization

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438631, 438636, 438646, 438672, H01L 21283, H01L 21324, H01L 21477

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active

059267364

ABSTRACT:
The present invention provides a method for minimizing voids in a plug. The process begins by forming a conformal barrier layer within the hole and then forming a metal plug within the hole. Thereafter, a cap layer is formed over the metal plug in which the cap layer has a lower thermal expansion coefficient than the metal plug. The hole is heated such that the metal in the hole flows to eliminate the void as a result of the compressive stress generated by the cap layer on the metal plug.

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Z. Shterenfeld-Lavie et al, "A 3-Level, 0.35 .mu.m Interconnection Process Using an Innovative, High Pressure Aluminum Plug Technology," Proceedings of the VMIC Conf., pp. 31-37 (Jun. 27-29, 1995).

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