Method for fabricating semiconductor memory element

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438397, H01L 2170

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active

056542232

ABSTRACT:
A method for fabricating a semiconductor memory element which has an excellent insulation property suitable for high density integration, including the steps of forming self-aligning plate electrodes by etching a dielectric film covering an upperside protective layer by an amount sufficient to expose each of the dielectric films, forming a third insulation film the entire surface thereof, exposing the upperside protection layer by etching the third insulation film with photosensitive films used as masks, forming a bit line contact by etching the upperside protection layer and the underside protection layer until the impurity region through the bit line contact.

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patent: 5536673 (1996-07-01), Hong et al.
patent: 5567639 (1996-10-01), Chang

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