4. Optics: measuring and testing
  5. Lamp beam direction or pattern

Yutaka Ishizaka

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Inspecting device and method for detecting minute contour defect

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet
Patent

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Light destribution of headlight beam

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Light distribution of headlight beam

Optics: measuring and testing – Lamp beam direction or pattern
Patent

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Pattern rotation angle detecting system

Image analysis – Histogram processing – For setting a threshold
Patent

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System for detecting rotational angle of objective pattern

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-112613

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