Inspecting device and method for detecting minute contour defect

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet

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Details

25055922, 382141, G01N 2188

Patent

active

056915438

ABSTRACT:
A contour inspecting device for detecting a defect in a contour of an object to be inspected according to the invention comprises; an image memory for storing an image of the inspection object captured by a camera; a scanner for scanning, along a plurality of scanning lines, an inspection region which covers a part of the image stored in the image memory; a binary unit for converting an image signal read out by the scanner into a binary signal; a detector for detecting positions of changing points at which the value of the binary signal changes; a comparator for calculating a difference between positions of the changing points on two of the plurality of scanning lines separated from each other by a predetermined interval; and a decision unit for determining whether or not the contour of the inspection object has a defect on the basis of a comparison of the difference with a predetermined value.

REFERENCES:
patent: 5157735 (1992-10-01), Maeda et al.
patent: 5233199 (1993-08-01), Toyama
patent: 5268968 (1993-12-01), Yoshida
patent: 5287293 (1994-02-01), Chen et al.

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